Malvern Panalytical Future Days

Focus on Semiconductors

The Semiconductor Future Days event brought together distinguished industrial guest speakers and our in-house semiconductor specialists to explore the latest advancements in the silicon and compound semiconductor industry. 

From advanced silicon solutions for MEMS, RF and power electronics applications, to power GaN technology for mainstream applications and connected metrology for characterizing complex layer stacks, we covered a wide range of topics. We also discussed how to optimize XRF wafer metrology on a system and fab level, and presented new XRD solutions from lab to fab.

We kicked off with a warm welcome from our scientific experts before diving into the details!


Future Days - Introduction
 

We heard some fascinating presentations from guest speakers including Okmetic, Nexperia, and LayTec. We hope you gained valuable insights into the latest advancements in the silicon and compound semiconductor industry.

Find out how silicon is still pushing boundaries in advanced applications

Vesa Lempinen, Chief Quality Officer at Okmetic Oy, Finland, explores a wide range of next-generation silicon applications, and demonstrates how this established technology still has a lot to give to the dynamic and evolving semiconductor industry as it works to solve tomorrow’s challenges.

 
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Discover the everyday applications of cutting-edge technology

Dilder Chowdhury of Nexperia in the Netherlands shares his industry insights into the amazing potential of gallium nitride (GaN) technology to revolutionize mainstream applications, as the material starts to make serious waves in consumer goods.

 
Get his insights
Unleash the power of connected metrology in semiconductor manufacturing

Johannes Zettler, Product Manager at LayTec AG, Germany, follows the manufacturing chain in this talk exploring the power of a connected metrology strategy. Working with complex materials like semiconductors makes high-quality materials characterization essential – and Johannes demonstrates why.

 
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Optimize XRF wafer metrology at system- and fab-level

Vincent Kip dives deep into the versatile technique of X-ray fluorescence analysis and how it can create great value for the semiconductor industry – if it is used optimally.

 
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New XRD solutions from lab to fab

Lars Grieger explores some of the latest and greatest applications of X-ray diffraction technology – and how it is helping to shape the future of semiconductors, from the lab to the fab.

 
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Live round table

We ended the Malvern Panalytical Future Days, with a live round table discussion with all semiconductors experts.

 
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Gjalt Kuiperes, Sector Director Advanced Materials, Malvern Panalytical:

“The best way to predict the future is to create it! And, at Malvern Panalytical, we are helping to shape the future not only through our instruments and services, but also through our collaborations and engagements with industry partners. Together, we will deep dive into what the future will bring – and most importantly, how we can be a part of it!”

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